Figure 2

Uniform distribution (well-to-well variability) of CS aerosols at a single concentration of 32% (0.5 L/min). (a) Scatter blot showing the blank corrected OD values for WST-1 reduction, normalized to 100%, for each insert of the cultivation base module, from three independent CS exposure runs. Different insert positions in the respective rows of the cultivation base module (Row 1-7) are marked with different symbols. Raw p-values according to ANOM (Raw p) and adjusted p-values for multiple testing (Adj. p) are indicated on the bottom of the graph for each insert position (A: p < 0.05; B: p < 0.01 and C: p < 0.001). (b) Average optical density at 430 nm upon WST-1 reduction by CS exposure. Data points represent the mean ± SD from six inserts for CS exposed (rows 1-7) of the cultivation base module, the blank measurement, and exposure to fresh air. Different lines correspond to three different exposure runs, as shown below the graph. (c) Scatter blot for particle mass deposition, normalized to 100%, of different QCMs attached to Row 1-7. Raw p-values according to ANOM (Raw p) and adjusted p-values for multiple testing (Adj. p) are indicated on the bottom of the graph for each insert position (A: p < 0.05). Different symbols correspond to three different exposure runs, as shown below the graph. (d) The amount of particles measured on QCMs connected to each row of the dilution system (Row 1-7). Different lines correspond to three different exposure runs, as shown below the graph. (a + c) Lines at P95 and P5 refer to the 95 and 5 percentiles, respectively of all values. Statistics based on variance decomposition are shown in each graph. The respective p-values and n-numbers are also listed.