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Table 2 Specifications of the devices and the methods used for characterization of powders and consolidated samples

From: Comparison of the effect of argon, hydrogen, and nitrogen gases on the reduced graphene oxide-hydroxyapatite nanocomposites characteristics

Method Device Specification
XRD X’ Pert Pro, Panalytical Co Cu Kα radiation (λ = 1.5406 Å, 40 kV, 40 mA)
Raman spectroscopy Renishaw inVia spectrometer Wavelength of 532 nm, green laser (recording 5 times for 10 s of each accumulation)
FTIR VERTEX 70, Bruker Corp Applying 200 MPa pressures (1 mm thickness)
FESEM Hitachi S4700 equipped with energy dispersive X-ray spectroscopy Au coated by sputtering
TEM CM120, Philips
HAADF, EDS TALOS F200A with a twin lens system using TALOS microscope in STEM mode, exposure times of 5 min were used to create elemental distribution maps
ICP DV7300, Optima Co